作者: John Dumont
DOI: 10.1080/00438243.1982.9979861
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摘要: Abstract The author introduces the technique of interferometry to field microwear analysis as a method quantify certain aspects polish microtopographies, and features that can occur thereon, have hitherto defied rigorous description or analysis. newly available data is then interpreted through use an explicit model physical conditions necessary for development in order provide independent assessment particular causative contact/worked materials.