作者: R. J. Cernik , P. Barnes , G. Bushnell-Wye , A. J. Dent , G. P. Diakun
DOI: 10.1107/S0909049503027870
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摘要: A new beamline (MPW6.2) has been designed and built for the study of materials during processing where three synchrotron techniques, SAXS, WAXS XAS, are available simultaneously. It demonstrated that Rietveld refinable data can be collected from silicon SRM 640b over a 60 degrees range in time scale 1 s. The have refined to chi(2) 2.4, peaks fitting best Pearson VII function or with fundamental parameters. peak halfwidths found approximately constant at 0.06 120 angular indicating instrumental resolution matched its design specification. quantitative comparison sets on same isotactic polypropylene system MPW6.2 DUBBLE ESRF shows 17% improvement 1.8 peak-to-background ratio RAPID2 system; vary more smoothly across detector channels. time-dependent wide-angle XRD was tested by comparing hydration reaction gypsum-bassanite-anhydrite energy-dispersive scale. Three sample were selected analysis gave an average 3.8. Rietveld-refined lattice parameters good match published values corresponding errors show mean value 3.3 x 10(-4). also analysed Pawley decomposition phase-modelling technique demonstrating ability station quickly accurately identify phases. combined SAXS/WAXS capability crystallization spinodal very dilute polymer system. Our measurements high-density co-polymer (E76B38) as low 0.5% weight observed solution hexane. SAXS calibrated using collagen 30 orders diffraction s collection. XAS measurement observing collapse re-crystallization zinc-exchanged zeolite (zeolite Zn/Na-A). Previous studies this material 9.3 SRS compared those station. 38 better quality counting statistics. improved enabled identified.