Path-percolation modeling of electrical property variations with statistical procedures in spatially disordered inhomogeneous media

摘要: A current-path percolation model has been developed to simulate the electrical property variations in spatially-disordered inhomogeneous media by establishing a computational path determination scheme, i.e., cluster labeling process. This scheme eliminates necessity estimate bond resistance at lattice edges. Subsequently, an active clustering process provides more accurate effective values than both eective medium approximation (EMA) and Kirkpatrick algorithm. We apply present solid thin film mixture of temperaturedependent resistive materials. The results agree well with experimental data for pure phases VO 2 literature. Results show that VO2 films is rather strongly aected micro- or nano-structural configurations conductive materials films. It expected modeling combined can be applied investigating properties utilized as reverse engineering tool tailor