A Systematic Transmission Line Model for the Analysis of Self-Resonant Structures Within Multi-Layer Dielectric Media

摘要: This paper introduces a transmission line model analysis for dielectric-loaded self-resonant structures (SRSs). Equivalent circuit models, besides their fast computational time, usually offer some insights into the underlying physics of electromagnetic structures, hence simplifying and improving design optimization criteria these structures. A systematic approach deriving impedance expressions SRS on within multi-layer dielectric media is presented. The process extracting equivalent parameters from explained. trends are studied with different medium properties various angles incidence an multiple resonant states highlighting effect changing physical electrical dimensions parameters. responses compared to full-wave simulation results, accuracy assessed using mean absolute error criteria. Furthermore, new simplified method calculating forward coefficient proposed. expression offers fundamental factors contributing $S_{21}$ response. Finally, experimental measurements embedded in inside waveguide conducted very good agreement.