Industrial experience with test generation languages for processor verification
作者： Michael Behm , John Ludden , Yossi Lichtenstein , Michal Rimon , Michael Vinov
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摘要: We report on our experience with a new test generation language for processor verification. The verification of two superscalar multiprocessors is described and we show the ease expressing complex tasks. cost benefit are demonstrated: training takes up to six months; simulation time required desired level coverage has decreased by factor twenty; number escape bugs been reduced.
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