Gentle STEM: ADF imaging and EELS at low primary energies $
作者： Ondrej L. Krivanek , Niklas Dellby , Matthew F. Murfitt , Matthew F. Chisholm , Timothy J. Pennycook
DOI: 10.1016/J.ULTRAMIC.2010.02.007
关键词:
摘要: Aberration correction of the scanning transmission electron microscope (STEM) has made it possible to reach probe sizes close 1 ˚ A at 60 keV, an operating energy that avoids direct knock-on damage in materials consisting light atoms such as B, C, N and O. Although greatly reduced, some radiation is still present this energy, limits maximum usable dose. Elemental analysis by loss spectroscopy (EELS) then usefully supplemented annular dark field (ADF) imaging, for which signal larger. Because its strong Z dependence, ADF allows chemical identification individual atoms, both heavy light, can also record atomic motion considerable detail. We illustrate these points images EELS nanotubes containing nanopods filled with single Er, graphene impurity atoms.
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