Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

摘要: We have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at fixed distance from thin gold layer deposited on top superconducting wire. The studied as function distances to surface and Different regimes are observed, where loss rate determined either by technical current noise wire or Johnson-Nyquist metallic layer, good agreement with theoretical predictions. Far surface, we observe exceptionally long times for an atom-chip, 10 min range.