作者: Pranjal Kumar Gogoi , Zhenliang Hu , Qixing Wang , Alexandra Carvalho , Daniel Schmidt
DOI: 10.1103/PHYSREVLETT.119.077402
关键词:
摘要: Using wide spectral range in situ spectroscopic ellipsometry with systematic ultrahigh vacuum annealing and in situ exposure to oxygen, we report the complex dielectric function …