作者: Jiao Xu , Junming Chen , Dongping Zhang , Yonglu Wang , Yibin Zhang
DOI: 10.1364/AO.387206
关键词:
摘要: In a spectral beam combination system, temperature increase of the multilayer dielectric grating (MDG) worsens far-field quality output laser. To accurately monitor surface MDG, this study deposits VO2 phase-change film on lowest layer films in MDG and tests transmittance with probe Based measurement, can be calculated. Additionally, analyzes influence electric field −1 diffraction efficiency presents specific example using to test high reflector temperature. The concludes that is feasible method measuring better than an infrared thermal imager.