作者: Ann Wennerberg , Ari Ide-Ektessabi , Shino Hatkamata , Takashi Sawase , Carina Johansson
DOI: 10.1111/J.1600-0501.2004.01053.X
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摘要: OBJECTIVES: There may be a risk of greater ion release for surface-enlarged implants than conventionally turned components. The major aim the present paper was to investigate whether correlation exists between and surface roughness relevant today's commercial implants. Other aims were compare after two insertion times concentration in bone tissue as function distance from implant surface. MATERIAL AND METHODS: Lactic acid aqueous solution (pH=2.3) phosphate-buffered saline used vitro investigation. For vivo investigation, synchrotron radiation X-ray fluorescence (SRXRF) spectroscopy secondary mass (SIMS) performed 12 weeks 1 year implantation rabbit tibiae. RESULTS: average height deviation (S(a)) 0.7, 1.27, 1.43 2.21 microm, respectively, four surfaces investigated. No difference found vitro. In vivo, SRXRF demonstrated slightly higher values roughest up 400 microm surface; thereafter no found. SIMS smoothest surfaces, but more titanium weeks. Titanium rapidly decreased with CONCLUSION: At level oral implants, increasing release, neither nor vivo.