摘要: The broadening of the X-ray diffraction lines which occurs when crystals composing specimen are smaller than about 10-5 cm. edge length is well known. Since discovery this phenomenon by Scherrer in 1920 a fair amount work has been done on determination particle size from breadth lines. (1920), Bragg (1933) and Seljakow (1925) have calculated for cubic form belonging to system. For parallel monochromatic radiation point specimen, they agree upon formula βx = C λ/t cos 1/2 χ , where angular line defined below, t — crystal, λ= wave-length X-radiation, θ angle. values given constant 0·94, 0·89 0·92 respectively.
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N. Seljakow, Eine röntgenographische Methode zur Messung der absoluten Dimensionen einzelner Kristalle in Körpern von fein-kristallinischem Bau European Physical Journal. ,vol. 31, pp. 439- 444 ,(1925) , 10.1007/BF02980596
The resistance of superconducting cylinders in a transverse magnetic field Proceedings of The Royal Society A: Mathematical, Physical and Engineering Sciences. ,vol. 166, pp. 43- 55 ,(1938) , 10.1098/RSPA.1938.0080