An intensity evaluation method: EVAL-14
作者： Albert J. M. Duisenberg , Loes M. J. Kroon-Batenburg , Antoine M. M. Schreurs
DOI: 10.1107/S0021889802022628
关键词:
摘要: … The row 4, 5 and 6 gives the final results: the aliens are eliminated and the BPB method can be applied successfully. Window 7 shows the complete detector with the position of the …
narcis.nl参考文章(11)
Zbyszek Otwinowski, Wladek Minor, Processing of X-ray diffraction data collected in oscillation mode Methods in Enzymology. ,vol. 276, pp. 307- 326 ,(1997) , 10.1016/S0076-6879(97)76066-X
R. Bolotovsky, M. A. White, A. Darovsky, P. Coppens, The `Seed‐Skewness' Method for Integration of Peaks on Imaging Plates Journal of Applied Crystallography. ,vol. 28, pp. 86- 95 ,(1995) , 10.1107/S0021889894009696
H. Graafsma, S. O. Svensson, Å. Kvick, An X-ray charge-density feasibility study at 56 keV of magnesium formate dihydrate using a CCD area detector Journal of Applied Crystallography. ,vol. 30, pp. 957- 962 ,(1997) , 10.1107/S0021889897004135
D. Bourgeois, D. Nurizzo, R. Kahn, C. Cambillau, An Integration Routine Based on Profile Fitting with Optimized Fitting Area for the Evaluation of Weak and/or Overlapped Two-Dimensional Laue or Monochromatic Patterns Journal of Applied Crystallography. ,vol. 31, pp. 22- 35 ,(1998) , 10.1107/S0021889897006730
A. J. M. Duisenberg, Diffractometry and reflection profiles of anisotropic mosaic and split crystals Acta Crystallographica Section A. ,vol. 39, pp. 211- 216 ,(1983) , 10.1107/S0108767383000483
M. S. Lehmann, F. K. Larsen, A method for location of the peaks in step-scan measured Bragg reflexions Acta Crystallographica Section A. ,vol. 30, pp. 580- 584 ,(1974) , 10.1107/S0567739474001379
M. G. Rossmann, Processing oscillation diffraction data for very large unit cells with an automatic convolution technique and profile fitting Journal of Applied Crystallography. ,vol. 12, pp. 225- 238 ,(1979) , 10.1107/S0021889879012218
A. J. M. Duisenberg, Indexing in single‐crystal diffractometry with an obstinate list of reflections Journal of Applied Crystallography. ,vol. 25, pp. 92- 96 ,(1992) , 10.1107/S0021889891010634
L. E. Alexander, G. S. Smith, Single‐crystal intensity measurements with the three‐circle counter diffractometer Acta Crystallographica. ,vol. 15, pp. 983- 1004 ,(1962) , 10.1107/S0365110X62002613
R. Diamond, Profile analysis in single-crystal diffractometry Acta Crystallographica Section A. ,vol. 25, pp. 43- 55 ,(1969) , 10.1107/S0567739469000064