100-fold reduction of electric-field noise in an ion trap cleaned with in situ argon-ion-beam bombardment.

摘要: Motional heating of trapped atomic ions is a major obstacle to their use as quantum bits in scalable computer. The detailed physical origin this not well understood, but experimental evidence suggests that it caused by electric-field noise emanating from the surface trap electrodes. In study, we have investigated role adsorbates on electrodes identifying contaminant overlayers, implementing an situ argon-ion-beam cleaning treatment, and measuring ion rates before after treating electrodes' surfaces. We find 100-fold reduction rate treatment. experiments described here are sensitive low levels MHz frequency range. Therefore, approach could become useful tool science complements established techniques.