Column ratio mapping: a processing technique for atomic resolution high-angle annular dark-field (HAADF) images.
作者： Paul D. Robb , Alan J. Craven
DOI: 10.1016/J.ULTRAMIC.2008.08.001
关键词:
摘要: An image processing technique is presented for atomic resolution high-angle annular dark-field (HAADF) images that have been acquired using scanning transmission electron microscopy (STEM). This termed column ratio mapping and involves the automated process of measuring intensity ratios in high-resolution HAADF images. was developed to provide a fuller analysis than usual method drawing single line profiles across few areas interest. For instance, reveals compositional distribution whole allows statistical an estimation errors. has proven be very valuable as it can more detailed assessment sharpness interfacial structures from The described terms [1 1 0]-oriented zinc-blende structured AlAs/GaAs superlattice A-scale capability aberration-corrected SuperSTEM instrument.
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