An X-ray photoelectron spectroscopy study of the chemical changes in oxide and hydroxide surfaces induced by Ar+ ion bombardment

摘要: In the course of X-ray photoemission studies on oxidation metals and alloys bulk oxides, we found that in addition to physical sputtering Ar+ ion bombardment can many cases reduce an oxide a mixture original oxide, lower oxides metal. The effect is even more pronounced systems containing hydroxyl groups which are readily destroyed by beam. Specific examples for oxidized cobalt, nickel iron surfaces their hydroxides given. relative reduction rates CoII FeIII CoFe2O4 also examined. From these observations, it clear any depth compositional profiling using conjunction with Auger or photoelectron spectroscopy should be treated extreme caution. mechanism chemical changes induced briefly discussed.