作者: D. Briggs , S. C. Yoon , B. D. Ratner , M. J. Hearn
关键词:
摘要: A series of fluorine-containing segmented poly(ether urethanes) and urethane ureas), previously characterized by angular dependent x-ray photoelectron spectroscopy (XPS) have been re-examined using static secondary ion mass spectrometry (SIMS). Comparison the data from two techniques has shown that intensity signals which characterize hard soft segments can be used quantitatively for direct analyis molecular composition at surface. Moreover, SIMS sampling depth conditions to ∼ 10 A, significantly less than XPS under normal conditions, similar high glancing take-off angle (with respect surface normal).