作者: Marc Diepold , Luis MP Fernandes , Jorge Machado , Pedro Amaro , Marwan Abdou-Ahmed
DOI: 10.1063/1.4921195
关键词:
摘要: Avalanche photodiodes are commonly used as detectors for low energy x-rays. In this work, we report on a fitting technique to account different detector responses resulting from photoabsorption in the various avalanche photodiode layers. The use of results an improvement resolution at 8.2 keV by up factor 2 and corrects timing information 25 ns space dependent electron drift time. addition, waveform analysis is particle identification, e.g., distinguish between x-rays MeV electrons our experiment.