Application of hard X-ray photoelectron spectroscopy to electronic structure measurements for various functional materials
作者： S. Ueda
DOI: 10.1016/J.ELSPEC.2013.01.009
关键词:
摘要: … 6(a) shows the schematic diagram of the sample structure and the experimental geometry. … -rays due to the wide energy range covered by the revolver-type undulator. By using X-rays in …
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