A low-noise CCD input with reduced sensitivity to threshold voltage

作者: S. P. Emmons , A. F. Tasch , J. M. Caywood

DOI: 10.1109/IEDM.1974.6219744

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摘要: A CCD input structure is presented which derives the injected charge from difference between two voltage levels on a capacitive node, where both are set using same IGFET structure; near perfect threshold cancellation predicted. Data show spatial variations multiple at least an order of magnitude less than those achieved previously reported techniques.

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