Application of Transmitted Kikuchi Diffraction in Studying Nano-oxide and Ultrafine Metallic Grains
作者： Majid Abbasi , Dong-Ik Kim , Hwan-Uk Guim , Morteza Hosseini , Habib Danesh-Manesh
关键词:
摘要: Transmitted Kikuchi diffraction (TKD) is an emerging SEM-based technique that enables investigation of highly refined grain structures. It offers higher spatial resolution by utilizing conventional electron backscattered equipment on electron-transparent samples. A successful attempt has been made to reveal nano-oxide structures as well ultrafine severely deformed metallic grains. The effect beam current was studied. Higher currents enhance pattern contrast and intensity. Lower detector exposure times could be employed accelerate the acquisition time minimize drift carbon contamination. However, increase interaction volume compromise resolution. Lastly, TKD results were compared orientation mapping in TEM (ASTAR). Results indicate a combination EDS capable tool characterize grains such Al2O3 Cr2O3 with similar crystal
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