GGR Biennial Review: Key Advances in Secondary Ion Mass Spectrometry in the Geological Sciences during the Period 2008–2009

摘要: Secondary ion mass spectrometry (SIMS or microprobe) remains one of the most powerful techniques in analytical geochemist’s toolkit. The key strength SIMS is its capacity to provide trace element and isotope data at sampling sizes which are not approached by other methods. As compared with main competing technique laser ablation-ICP-MS, commonly provides a total some 10 500 times smaller; this feature can be deciding factor as whether an objective technically achievable. Additional strengths lie areas depth profiling imaging. Though perhaps used geosciences, these two operational modes represent unique capabilities SIMS.