Convergent Beam Electron Diffraction Basic principles

作者: J. Gjønnes

DOI: 10.1007/978-94-015-8971-0_6

关键词:

摘要: Convergent beam electron diffraction (CBED) is fairly recent as a standard technique in commercial microscopes. It was invented already 1939 by Mollenstedt [1]; applications crystallography were proposed MacGillavry [2] and Ackerman [3] the 1940’s. In mid 1960’s Goodman Lehmpfuhl [4] revived CBED an alternative to SAD spot patterns, which they saw poor substitutes for integrated intensities used X-ray crystallography. They turned Kossel-Mollenstedt or patterns way of recording one-or two-dimensional rocking curves instead.

参考文章(13)
W. Kossel, G. Möllenstedt, Elektroneninterferenzen im konvergenten Bündel Annalen der Physik. ,vol. 428, pp. 113- 140 ,(1939) , 10.1002/ANDP.19394280204
J. Gjønnes, A. F. Moodie, Extinction conditions in the dynamic theory of electron diffraction Acta Crystallographica. ,vol. 19, pp. 65- 67 ,(1965) , 10.1107/S0365110X65002773
Jon Gjønnes, Johan Taftø, Bloch wave symmetry in electron diffraction Ultramicroscopy. ,vol. 52, pp. 445- 453 ,(1993) , 10.1016/0304-3991(93)90059-7
Y. F. Cheng, W. Nüchter, J. Mayer, A. Weickenmeier, J. Gjønnes, Low-Order Structure-Factor Amplitude and Sign Determination of an Unknown Structure AlmFe by Quantitative Convergent-Beam Electron Diffraction Acta Crystallographica Section A. ,vol. 52, pp. 923- 936 ,(1996) , 10.1107/S0108767396008379
A. F. Moodie, J. Etheridge, C. J. Humphreys, The Symmetry of Three-Beam Scattering Equations: Inversion of Three-Beam Diffraction Patterns from Centrosymmetric Crystals Acta Crystallographica Section A. ,vol. 52, pp. 596- 605 ,(1996) , 10.1107/S0108767396001171
J. Gjønnes, R. Høier, The application of non-systematic many-beam dynamic effects to structure factor determination Acta Crystallographica Section A. ,vol. 27, pp. 313- 316 ,(1971) , 10.1107/S0567739471000743
D. Watanabe, R. Uyeda, A. Fukuhara, Determination of the atom form factor by high‐voltage electron diffraction Acta Crystallographica Section A. ,vol. 25, pp. 138- 140 ,(1969) , 10.1107/S0567739469000222
J. Taft∅, J. Gj∅nnes, The intersecting Kikuchi line technique; critical voltage at any voltage Ultramicroscopy. ,vol. 17, pp. 329- 334 ,(1985) , 10.1016/0304-3991(85)90199-8
K. Gjønnes, J. Gjønnes, J. Zuo, J. C. H. Spence, Two-beam features in electron diffraction patterns ― application to refinement of low-order structure factors in GaAs Acta Crystallographica Section A. ,vol. 44, pp. 810- 820 ,(1988) , 10.1107/S0108767388004362