Effect of defect-induced internal field on the aging of relaxors

摘要: The effect of a defect-induced internal field on the dielectric response relaxor ferroelectrics is investigated using Monte Carlo simulation. It was observed that only at small temperature range near maximum does susceptibility decrease markedly due to field. This increases with enhancing We found almost independent width low width, and then decreases linearly width. dependence very similar relation constant logarithmic aging time, which probably suggests linear logarithm time. frequency sensitive temperature. With increasing temperature, curve change against varies from concave approximately linear, convex, in agreement recent rate measurement.