Optimized alignment of X-ray mirrors with an automated speckle-based metrology tool
作者： T. Zhou , H. Wang , O. J. L. Fox , K. J. S. Sawhney
DOI: 10.1063/1.5057712
关键词:
摘要: X-ray mirrors are widely used in beamlines and laboratories as focusing or collimating optics. As well the highly accurate processes to fabricate them, optimized alignment of also plays an important role achieving ideal beam. Currently, knife-edge scans most often method for aligning mirrors, which can characterize focal size tune iteratively. However, scanning provides only one-dimensional information this suffers from being time-consuming requiring a high-resolution piezo translation stage. Here we describe straightforward non-iterative mirror by measuring relationship between tilt aberration misaligned pitch angle, is retrieved at-wavelength metrology technique using randomly shaped wavefront modulator. Software graphical user interface have been developed automate process. Combining user-friendly flexibility technique, believe proposed software benefit researchers working at synchrotron facilities on laboratory sources.
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