作者: A. Zaafouri , M. Megdiche , M. Gargouri
DOI: 10.1007/S11581-015-1365-7
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摘要: The polycrystalline samples of Li4P2O7 were prepared by solid-state reaction technique. formation the compounds was checked X-ray diffraction technique (XRD). Detailed dielectric and electrical properties analyzed as a function frequency (200 Hz–5 MHz) temperature (611–671 K). impedance data well fitted to two equivalent circuits. results modulus study reveal presence distinct relaxation processes suggesting grains grain boundaries in sample. Analysis constants e″ loss tangent tan (δ) with shows distribution times. activation energy found from Arrhenius plot confirms that conduction process material is not due simple hopping mechanism. dependence exponent s investigated understand mechanism Li4P2O7. overlapping large polaron tunneling (OLPT) model can explain exponent.