Study of the Precision of X-ray Stress Analysis

摘要: Abstract : Software is described for complete computer control of residual stress measurements. One program (that incorporates either the two tilt method, sin squared psi procedure, or Cohen-Marion technique) has been developed use with a normal detector position sensitive detector. The operator inputs desired error in and various instrumental parameters that determine systematic errors. counting strategy to obtain total then determined by software. Employing this automated system, an investigation parabolic fit top diffraction profile indicates three point satisfactory only sharp profiles. Surprisingly, standard fixed time data accumulation, procedure gives better precision than method. A system exhibited excellent replicate Errors + - 6000 were obtained on samples having broad profiles 30 seconds. It was also found sample displacement less important stationary slit geometry parafocusing technique. Parallel beam shows minimal effects due (as well known) but measurement decreases because broadens profile. Design portable unit based these results are discussed. This research supported U.S. Office Naval Research. (Author)