High Angular Resolution EBSD and Its Materials Applications
作者： Claire Maurice , Romain Quey , Roland Fortunier , Julian H. Driver
DOI: 10.1002/9783527652815.CH14
关键词:
摘要:
sci-hub.se 参考文章(35)
F. J. Humphreys, Review Grain and subgrain characterisation by electron backscatter diffraction Journal of Materials Science. ,vol. 36, pp. 3833- 3854 ,(2001) , 10.1023/A:1017973432592
Angus J. Wilkinson, Measurement of elastic strains and small lattice rotations using electron back scatter diffraction. Ultramicroscopy. ,vol. 62, pp. 237- 247 ,(1996) , 10.1016/0304-3991(95)00152-2
Ken Mingard, Austin Day, Claire Maurice, Peter Quested, Towards high accuracy calibration of electron backscatter diffraction systems. Ultramicroscopy. ,vol. 111, pp. 320- 329 ,(2011) , 10.1016/J.ULTRAMIC.2011.01.012
B.S El-Dasher, B.L Adams, A.D Rollett, Viewpoint: experimental recovery of geometrically necessary dislocation density in polycrystals Scripta Materialia. ,vol. 48, pp. 141- 145 ,(2003) , 10.1016/S1359-6462(02)00340-8
S. VILLERT, C. MAURICE, C. WYON, R. FORTUNIER, Accuracy assessment of elastic strain measurement by EBSD Journal of Microscopy. ,vol. 233, pp. 290- 301 ,(2009) , 10.1111/J.1365-2818.2009.03120.X
Mayumi Ojima, Yoshitaka Adachi, Seiichi Suzuki, Yo Tomota, Stress partitioning behavior in an fcc alloy evaluated by the in situ/ex situ EBSD-Wilkinson method Acta Materialia. ,vol. 59, pp. 4177- 4185 ,(2011) , 10.1016/J.ACTAMAT.2011.03.042
T.B. Britton, C. Maurice, R. Fortunier, J.H. Driver, A.P. Day, G. Meaden, D.J. Dingley, K. Mingard, A.J. Wilkinson, Factors affecting the accuracy of high resolution electron backscatter diffraction when using simulated patterns. Ultramicroscopy. ,vol. 110, pp. 1443- 1453 ,(2010) , 10.1016/J.ULTRAMIC.2010.08.001
Phani S. Karamched, Angus J. Wilkinson, High resolution electron back-scatter diffraction analysis of thermally and mechanically induced strains near carbide inclusions in a superalloy Acta Materialia. ,vol. 59, pp. 263- 272 ,(2011) , 10.1016/J.ACTAMAT.2010.09.030
KRIEGER LASSEN, Source point calibration from an arbitrary electron backscattering pattern Journal of Microscopy. ,vol. 195, pp. 204- 211 ,(1999) , 10.1046/J.1365-2818.1999.00581.X
J.F Nye, Some geometrical relations in dislocated crystals Acta Metallurgica. ,vol. 1, pp. 153- 162 ,(1953) , 10.1016/0001-6160(53)90054-6