作者: Yamamoto Roh
DOI:
关键词:
摘要: A test circuit is incorporated in an IC without increase a chip area. The includes plurality of pins, current sensing circuits, and generation circuit. circuits process currents flowing through the pins parallel generates digital data, for example. capacitor reference corresponding to amount electric charge capacitor. can be controlled by voltage input capacitor, thus range output made wide. used testing circuits. source driver display panel, In this case, pixels panel sensed