作者: Neal B. Gallagher , Thomas A. Blake , Paul L. Gassman
DOI: 10.1002/CEM.929
关键词:
摘要: Scattering artifacts adversely affect infrared reflectance measurements of powders and soils, extended inverse scatter correction (EISC) is a flexible method useful for correcting these artifacts. EISC was used to correct mid-infrared spectra two different soils coated with dibutyl phosphate the results were examined using regression analysis. To obtain correction, fits measured spectrum reference spectrum. However, if contain features not included in fit can be biased resulting poor correction. Weighted robust least squares account potential biases. Additionally, present work demonstrates how analyte-free samples determine basis functions an mixture model Corrected resulted partial models that performed at as well 2nd derivative more interpretable. Copyright © 2006 John Wiley & Sons, Ltd.