作者: G. N. Kwawer , T. J. Miller , M. G. Mason , Y. Tan , F. C. Brown
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摘要: Using polarized synchrotron radiation, angle-resolved photoemission data were obtained on randomly oriented polycrystalline AgBr and thick films of metallic silver. Asymmetry parameters as well relative cross sections determined for the valence bands both systems from 55 eV through Ag 4d Cooper minimum at 140 eV. Comparison asymmetry with atomic indicates that derived levels in these are remarkably atomiclike. In only uppermost show a greatly reduced excursion \ensuremath{\beta} value minimum.