Electric currents in networks of interconnected memristors.

作者: Ehsan Nedaaee Oskoee , Muhammad Sahimi

DOI: 10.1103/PHYSREVE.83.031105

关键词:

摘要: Chua [IEEE Trans. Circuit Theory 1, 507 (1971).] argued that, in addition to the standard resistors, capacitors, and inductors, there must be a fourth fundamental element electrical circuits, which he called memory resistor or memristor. Strukov et al. [Nature (London) 453, 80 (2008)] showed how memristive behavior arises some thin semiconducting films. Unlike other passive elements, however, memristor with large sizes cannot fabricated, because scale up of dimensions order microns causes loss effect by decreasing width doped region relative overall size A microscale is, essential most potential applications. One way fabricating such without losing is make network very small interconnected memristors. We report results numerical simulations currents networks memristors, as well memristors Ohmic conductors. The exhibit rich variety interesting properties, including weakly strongly regimes, possible first-order transition at connectivity threshold, generation second harmonics regime, universal dependence network's strength on frequency. Moreover, we show that polarity can play an important role properties network, particular its speed switching, may have potentially application faster computers. None these are exhibited linear networks, even nonlinear effect.

参考文章(30)
Yuriy V. Pershin, Massimiliano Di Ventra, Current-voltage characteristics of semiconductor/ferromagnet junctions in the spin-blockade regime Physical Review B. ,vol. 77, pp. 073301- ,(2008) , 10.1103/PHYSREVB.77.073301
Jørgen Vitting Andersen, Didier Sornette, Kwan-tai Leung, Tricritical Behavior in Rupture Induced by Disorder Physical Review Letters. ,vol. 78, pp. 2140- 2143 ,(1997) , 10.1103/PHYSREVLETT.78.2140
A. L. Hodgkin, A. F. Huxley, A quantitative description of membrane current and its application to conduction and excitation in nerve The Journal of Physiology. ,vol. 117, pp. 500- 544 ,(1952) , 10.1113/JPHYSIOL.1952.SP004764
C Pennetta, E Alfinito, L Reggiani, S Ruffo, Non-Gaussian resistance noise near electrical breakdown in granular materials Physica A-statistical Mechanics and Its Applications. ,vol. 340, pp. 380- 387 ,(2004) , 10.1016/J.PHYSA.2004.04.030
C. D. Mukherjee, K. K. Bardhan, Critical behavior of thermal relaxation near a breakdown point. Physical Review Letters. ,vol. 91, pp. 025702- ,(2003) , 10.1103/PHYSREVLETT.91.025702
Scott Kirkpatrick, Percolation and Conduction Reviews of Modern Physics. ,vol. 45, pp. 574- 588 ,(1973) , 10.1103/REVMODPHYS.45.574
Jason J. Blackstock, William F. Stickle, Carrie L. Donley, Duncan R. Stewart, R. Stanley Williams, Internal Structure of a Molecular Junction Device: Chemical Reduction of PtO2 by Ti Evaporation onto an Interceding Organic Monolayer Journal of Physical Chemistry C. ,vol. 111, pp. 16- 20 ,(2007) , 10.1021/JP066266V
J. Joshua Yang, Matthew D. Pickett, Xuema Li, Douglas A. A. Ohlberg, Duncan R. Stewart, R. Stanley Williams, Memristive switching mechanism for metal/oxide/metal nanodevices. Nature Nanotechnology. ,vol. 3, pp. 429- 433 ,(2008) , 10.1038/NNANO.2008.160
James M Tour, Tao He, None, Electronics: the fourth element. Nature. ,vol. 453, pp. 42- 43 ,(2008) , 10.1038/453042A