作者: Jean-Paul Gourlot , Richard Frydrych , Michel Giner , Mourad Krifa , O. Tamime
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摘要: At present, many cottons are contaminated to varying degrees by Seed Coat Fragments (SCF) and insect honeydew. It is essential obtain more information on the quality of raw material a precise description yam quality. This paper deals with two instruments developed Cirad's Cotton Technology Laboratory for detecting counting these contaminants. The relationship Trashcam (an image analysis method SCF), H2SD (High Speed Stickiness Detector) reference methods discussed. (Resume d'auteur)