Neutron reflectometry and hard X-ray photoelectron spectroscopy study of the vertical segregation of PCBM in organic solar cells
作者： Antonio Urbina , José Abad , Antonio J. Fernández Romero , Jesús S. Lacasa , Jaime Colchero
DOI: 10.1016/J.SOLMAT.2018.10.004
关键词:
摘要: Abstract The composition of the active layer a benchmark functional glass/ITO/[P3HT:PCBM][1.1:1]/Al organic solar cell has been studied by neutron reflectometry (NR) and hard X-ray photoelectron spectroscopy (HAXPES). Thermal annealing was performed in several steps NR HAXPES were recorded for every temperature. By fitting results to model composed layers, scattering length density (SLD) distribution through sample obtained, from this SLD profile, evolution as function temperature established. For outer confirm evolution. show that PCBM tends segregate reducing initial concentration central part increasing its towards both interfaces. effect Al electrode on nearest zone (up 50 nm) is stabilize P3HT depletion area, an which not affected thermal annealing.
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