Scanning tunneling potentiometry

作者: P. Muralt , D. W. Pohl

DOI: 10.1063/1.96491

关键词:

摘要: In certain problems of electrical transport through condensed matter, it is important to know the potential distribution with microscopic resolution, e.g., at interfaces (Schottky barriers) or pn junctions. Scanning tunneling potentiometry, a new application scanning microscopy, capable providing this information. The tunnel current used for simultaneously sensing probe-to-sample distance and local potential. method was tested gold-island metal-insulator-metal structure.

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