Digital on-chip measurement circuit for built-in phase noise testing
作者： S. David-Grignot , F. Azais , L. Latorre , F. Lefevre
DOI: 10.1109/IMS3TW.2015.7177880
关键词:
摘要: This paper presents a digital on-chip measurement circuit for built-in phase noise evaluation of analog/IF signals. The technique relies on 1-bit acquisition and on-the-fly processing to …
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