作者: M. Aßmus , S. Nold , S. Rein , M. Hofmann , J. Rentsch
DOI: 10.1016/J.EGYPRO.2012.07.043
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摘要: Abstract During the production of silicon solar cells crack detection systems can help to sort out damaged wafers and reduce wafer breakage before they enter line. In order be cost effective, system needs minimize false detections as much possible. False in occur when bad are not detected or good falsely bad. The first error leads an increase cell breakage, second raises costs because non-damaged sorted prior processing. this work a model has been developed calculate maximum allowable rates achieve per benefit. Therefore rate dependent throughput calculation, based on manufacturing data, implemented. A sensitivity analysis shows that avoiding high sorting is crucial favor implementation system.