作者: H. Guo , J. Burgess , S. Street , A. Gupta , T. G. Calvarese
DOI: 10.1063/1.2221894
关键词:
摘要: Epitaxial thin films of La2NiMnO6, a ferromagnetic semiconductor, have been fabricated on different substrates by pulsed laser deposition. The x-ray diffraction and Raman scattering observations reveal that the are single crystalline an orthorhombic structure. magnetic properties films, including coercive field, remanent magnetization, Curie temperature, strongly dependent choice substrate. optimized exhibit moment 4.63μB∕f.u. at 5K, with temperature close to 280K. film characteristics promising for potential device applications in information storage, spintronics, sensors.