Laser‐induced breakdown by impact ionization in SiO2 with pulse widths from 7 ns to 150 fs

作者: D. Du , X. Liu , G. Korn , J. Squier , G. Mourou

DOI: 10.1063/1.111350

关键词:

摘要: … Increasingly, high laser power is achieved with moderate amount of energy (-joules) by re… on the pulse width of the laser pulses. An empirical scaling law of the fluence breakdown …

参考文章(14)
W. Shockley, Problems related top-n junctions in silicon Czechoslovak Journal of Physics. ,vol. 11, pp. 81- 121 ,(1961) , 10.1007/BF01688613
M.V. Fischetti, D.J. DiMaria, Hot electrons in SiO2: ballistic to steady-state transport Solid-state Electronics. ,vol. 31, pp. 629- 636 ,(1988) , 10.1016/0038-1101(88)90357-7
R.C. Hughes, High field electronic properties of SiO2 Solid-State Electronics. ,vol. 21, pp. 251- 258 ,(1978) , 10.1016/0038-1101(78)90145-4
Laser induced damage in optical materials, 1978 NASA STI/Recon Technical Report N. ,vol. 79, pp. 29507- ,(1979) , 10.1520/STP689-EB
K. K. Thornber, Applications of scaling to problems in high-field electronic transport Journal of Applied Physics. ,vol. 52, pp. 279- 290 ,(1981) , 10.1063/1.328490
Eli Yablonovitch, N. Bloembergen, Avalanche Ionization and the Limiting Diameter of Filaments Induced by Light Pulses in Transparent Media Physical Review Letters. ,vol. 29, pp. 907- 910 ,(1972) , 10.1103/PHYSREVLETT.29.907
Donna Strickland, Gerard Mourou, Compression of amplified chirped optical pulses Optics Communications. ,vol. 55, pp. 219- 221 ,(1985) , 10.1016/0030-4018(85)90120-8
D. J. DiMaria, J. R. Abernathey, Electron heating in silicon nitride and silicon oxynitride films Journal of Applied Physics. ,vol. 60, pp. 1727- 1729 ,(1986) , 10.1063/1.337265
Scott C. Jones, Peter Braunlich, R. Thomas Casper, Xiao-An Shen, Paul Kelly, Recent Progress On Laser-Induced Modifications And Intrinsic Bulk Damage Of Wide-Gap Optical Materials Optical Engineering. ,vol. 28, pp. 1039- 1068 ,(1989) , 10.1117/12.7977089
P. A. Wolff, Theory of Electron Multiplication in Silicon and Germanium Physical Review. ,vol. 95, pp. 1415- 1420 ,(1954) , 10.1103/PHYSREV.95.1415