Real space imaging of the microscopic origins of the ultrahigh dielectric constant in polycrystalline CaCu3Ti4O12
作者： Sergei Kalinin , Arthur P Baddorf , Gabriel M Veith , Maxim Lobanov , Junsoo Shin
DOI: 10.1063/1.1880432
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摘要: The origins of an ultrahigh dielectric constant in polycrystalline CaCu3Ti4O12 (CCTO) were studied using the combination impedance spectroscopy, electron microscopy, and scanning probe microscopy (SPM). Impedance spectra indicate that transport properties 0.1Hz–1MHz frequency range are dominated by a single parallel resistive-capacitive (RC) element with characteristic relaxation 16Hz. dc potential distributions measurements SPM illustrate significant drops occur at grain boundaries, which thus can be unambiguously identified as dominant RC element. High ac amplitude phase very weak boundary contrast SPM, indicative strong capacitive coupling across interfaces. These results demonstrate reported for CCTO materials is related to grain-boundary behavior.
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