作者: Dinesh Varshney , Kavita Verma
DOI: 10.1016/J.MOLSTRUC.2012.10.049
关键词:
摘要: Abstract Chemical co-precipitation method is employed to examine the effect of stirring time on particle size and dielectric properties SnO2 nanoparticles. XRD patterns followed by Rietveld analysis revealed as-prepared samples be pure tetragonal (P42/mnm) with rutile structure. The average crystalline increases from 26 nm 32 nm as increased 5 min 20 min confirmed TEM measurements. appearance additional Raman peak at about 540, 574 696 cm−1 an indicative characteristic crystal symmetry due nano-size agglomeration grains in nanocrystalline tin oxide. XPS reveals that Sn exist 4+ oxidation state. constant loss tangent stirred sample greatest compared prepared time.