Device for measuring the roughness of a surface

摘要: An apparatus is disclosed for measuring the roughness of a surface with improved accuracy. The apparatus, several embodiments which are disclosed, includes device illuminating being studied and photosensitive detector determining maximum intensity light reflected on surface. Apparatus also provided detemining two points at has fallen to selected fraction its intensity. distance between these then measured along intersection plane incidence beam perpendicular direction specular reflection. This provides an accurate quantitative measure studied.