作者: Niels J. Blunch
DOI:
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摘要: PART ONE: PREPARING YOURSELF AND YOUR DATA Introduction Measuring Your Variables: Reliability and Validity Factor Analysis TWO: THE THREE BASIC MODELS Structural Equation Modeling with AMOS Models Only Manifest Variables The Measurement Model in SEM: Confirmatory General THREE: ADVANCED TECHNIQUES Mean Structures Multi-Group Incomplete Non-Normal Data Latent Curve