Characterization of frequency-selective surface spatial filters in a rectangular waveguide

摘要: The possibility to characterize infinite and periodic frequency-selective surfaces (FSS) filters that have two orthogonal axes of symmetry inside a waveguide is reported. Thus, preliminary measurements can rapidly be obtained at low cost with few elementary cells instead using large FSS panel in free space. This possible because the equivalence exists between electromagnetic fields symmetric oblique plane waves incident on reflected from an surface incident/reflected exist single-mode rectangular containing finite number cells. Comparisons some full-wave simulations for belonging first three groups as they were defined by Munk confirm good agreement them. interesting simple assessment tool concerning fabrication quality FSS. extension this technique non-symmetric patterns also discussed supported experimental simulation results. limitations are finally discussed.