Application of X-ray fluorescence in an investigation of photographic heritage
作者： T. Čechák , I. Kopecká , T. Trojek , T. Štanzel , H. Bártová
DOI: 10.1016/J.RADPHYSCHEM.2015.05.015
关键词:
摘要: Abstract X-ray fluorescence analysis uses ionizing radiation to study the elemental composition of materials. It is widely used for many purposes, including studies various cultural and historic relicts objects art. This paper summarizes our experience with attenuated total reflectance Fourier transform infrared spectroscopy in investigating historical photographs by means portable spectroscopic devices. The results these measurements provide information about their toning. They can be comparing processes fabricating photographs, assessing quality and, cases, how repair damaged parts.
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