Programmable pattern generator

作者: Charles K. Snodgrass , Bruce A. Dickey

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摘要: A pattern generator includes an address generator, topology and a data generator. The is adapted to provide first having plurality of bits. programmable logic gates. Each gate the coupled receive at least subset gates generate second modified bits write based on method for generating generated. combination subsets Write generated

参考文章(6)
Atsushi Saito, Test pattern generator ,(1990)
Kenichi Fujisaki, Multiple bit test pattern generator ,(1996)
Sato Norihiko, Kubota Shinobu, TEST PATTERN GENERATOR ,(1995)