Experimental low-voltage point-projection microscopy and its possibilities
作者： J.C.H. Spence , W. Qian , A.J. Melmed
DOI: 10.1016/0304-3991(93)90063-4
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摘要: Abstract The design of a lensless, low-voltage point-projection electron microscope is described, operating at 90–400 V. Experimental images thin carbon films are reported, and it shown that high-resolution may be obtained without high-temperature treatment the tip, greatly simplifying construction improving stability. Image interpretation, radiation damage, source brightness, tip aberrations applications instrument discussed, effective size estimated.
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