Optical properties of Cd3As2 polycrystalline thin films

摘要: Abstract The transmittance T and reflectance R have been measured at normal incidence of light for a set vacuum deposited Cd3As2 thin films different thickness in the wavelength range 0.5–10 μm. values conjunction with film were used to determine optical constants (the refractive index n, absorption k coefficient α) films. lattice dielectric constant was found be 17.6. Graphical representation log (αhν) versus ( 1 λ ) yielded three distinct linear regions. first region had photon energy up 0.3 eV. second 0.3–0.9 third 0.95–2.1 It that only allowed type transitions indirect an gap Eding = 0.05 In region, transition direct Egd 0.72 1.56 last two confirmed throughout graphical of- lm( e f(hv) . existing above mentioned regions interpreted according LinChung model.