Recent Developments in Spectromicroscopy with the X1-SPEM

摘要: At the last International Symposium on X-Ray Microscopy, held at Brookhaven National Lab in 1987, we contemplated possibility of a photoemission microscope Synchrotron Light Source (NSLS) [1]. Subsequently designed, developed and commissioned first generation scanning microscope, X1-SPEM, beamline X1A NSLS, recorded images [2,3]. More recently, reported submicron any utilizing primary photoelectrons [4]. Here, will present further improved establish limititations instrument spatial energy resolution, as well elemental chemical sensitivity. We furthermore outline estimated performance an second instrument.