Interconnection of the parameters obtained from the dielectric spectrum of CaF2 doped with ErF3 and YbF3
作者： Aglaia Vassilikou-Dova , Vassiliki Katsika-Tsigourakou
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摘要: A model has been suggested long ago that interconnects point defect parameters with bulk properties. On this basis, the ra-tio of migration entropy sm and enthalpy hm should be equal to a quantity. The validity prediction is studied here for deduced from pre-exponential factor τ0 over activation energy E involved in Arrhenius relation τ = exp (E /kT) relaxation time τ. study focused on so called RI-relaxation CaF2 doped ErF3 YbF3. (© 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
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