作者: Chi-Kuang Sun , Yu-Chieh Wen , Chien-Cheng Chen
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摘要: The present disclosure provides solutions to probing an interface. With a noninvasive measuring device provided in one embodiment of the disclosure, acoustic wave whose frequency is higher than approximately 300 GHz generated propagate buffering film. reflection from interface object be measured interfacing with film, it possible that at least physical property may analyzed, preferably 0.3 nm resolution.